The Development of a Kind of Apparatus for Measuring Infrared Spectral Emissivity

WAN Zhi; REN Jian-wei; LI Xian-sheng; LIU Ze-xun

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The Development of a Kind of Apparatus for Measuring Infrared Spectral Emissivity

更新时间：2020-08-11

- The Development of a Kind of Apparatus for Measuring Infrared Spectral Emissivity
- Chinese Journal of Luminescence Vol. 29, Issue 1, Pages: 200-203(2008)
- 作者机构：
  
  1. 中国科学院长春光学精密机械与物理研究所,吉林长春,中国,130033
  2. 中国科学院研究生院北京,100049
- 作者简介：
- 基金信息：
- DOI：
  CLC： O472.3;TN304.23;O482.31
- Received：25 August 2007，
  
  Revised：24 November 2007，
  
  Published：20 January 2008
- 稿件说明：
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郑卫民, 吕英波, 宋淑梅, 王爱芳, 陶琳. GaAs/AlAs量子阱中受主束缚能和光致发光[J]. 发光学报, 2008,29(1): 156-160

ZHENG Wei-min, LÜ Ying-bo, SONG Shu-mei, WANG Ai-fang, TAO Lin. Photoluminescence Study of the Acceptor Binding Energy in GaAs/AlAs Quantum Wells[J]. Chinese Journal of Luminescence, 2008,29(1): 156-160
郑卫民, 吕英波, 宋淑梅, 王爱芳, 陶琳. GaAs/AlAs量子阱中受主束缚能和光致发光[J]. 发光学报, 2008,29(1): 156-160 DOI：

ZHENG Wei-min, LÜ Ying-bo, SONG Shu-mei, WANG Ai-fang, TAO Lin. Photoluminescence Study of the Acceptor Binding Energy in GaAs/AlAs Quantum Wells[J]. Chinese Journal of Luminescence, 2008,29(1): 156-160 DOI：

摘要

研制了一种利用对称双光路比对法测量材料表面光谱发射率的装置

该装置采用多光谱辐射测温技术测量材料表面温度

解决了不规则材料表面温度难以精确测定的问题

实现了材料表面半球发射率和表面温度的同时测定。

Abstract

A kind of spectral emissivity measuring apparatus has been developed

which can perform spectral emissivity measurement by means of comparing two symmetric beam paths. The apparatus can be used to measure the surface temperature of material by utilizing multispectral pyrometry

and the problem that irregular surface temperature of material is hard to be exactly measured was resolved. The surface emissivity and surface temperature measurements were realized synchronously.

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