The paper indicates that ZnS

1-x

Te

x

alloy thin films have highly efficient light emission. Very strong photoluminescence was observes in samples. The color of the emitted light can be tuned from deep blue to yellow by adjusting Te composition. ZnS

1-x

Te

x

is a promising material for short wavelength optoelectronic applications and ultraviolet detectors. It’s important that studying the preparation and properties of ZnS

1-x

Te

x

alloys especially their thin films. And it’s an indispensable work to exploit and apply the alloys. In this paper the ZnS

1-x

Te

x

polycrystalline thin film preparation by vacuum evaporation and their property studies by AFM(atomic force microscope)

XRD(X-ray diffraction)

EDS(X-ray energy decompose)

UV-visible absorption spectrum and PL(photoluminescence) spectrum were presented. The properties include the morphology

structure

composition

ultraviolet absorption spectra and photoluminescence spectra. The films deposited on glass

quartz glass and silicon substrates. The study of morphology indicates that the ZnS

1-x

Te

x

thin films are uniformly and polycrystalline in nature. The crystallization of films is good. The average diameter of grain is about 20nm

and the figure is ellipse. The method of vacuum evaporation leads to an inhomogeneity in the difference growth directions. The films belong to zinc blende structure. The comparison between the compositions of Te and S is showed by component studies. The UV visible absorption spectrum shows a very strong absorptive peak in ultraviolet extent and the absorption in visible light extent is low. Photoluminescence spectrum of these films shows an emission centered at 470nm that is in visible light extent. And the spectrum has fine details. The emission can be observed by naked eyes. The results indicated that these films possess some good properties of single crystal films

for example

ultraviolet absorption and photoluminescence.