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Reliability of High-power Semiconductor Laser Diodes
更新时间：2020-08-11

    • Reliability of High-power Semiconductor Laser Diodes

    • Chinese Journal of Luminescence   Vol. 24, Issue 1, Pages: 100-102(2003)
    • CLC： TN365

    • Received：23 July 2002，

      Revised：20 November 2002，

      Published：20 January 2003

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  • CAO Yu-lian, WANG Le, LIAO Xin-sheng, CHENG Dong-ming, LIU Yun, WANG Li-jun. Reliability of High-power Semiconductor Laser Diodes[J]. Chinese Journal of Luminescence, 2003,24(1): 100-102 DOI：

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