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Study on New MCP Reflection X-ray Sensitive Film of Variable Density Halide
更新时间:2020-08-11
    • Study on New MCP Reflection X-ray Sensitive Film of Variable Density Halide

    • Chinese Journal of Luminescence   Vol. 23, Issue 5, Pages: 513-517(2002)
    • CLC: TN144.1
    • Received:20 June 2002

      Revised:15 August 2002

      Published:20 September 2002

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  • TIAN Jing-quan, JIANG De-long, SUN Xiu-ping, FU Li-chen, DAN Tang-ren, LI Ye, LU Yao-hua, DUANMU Qing-duo. Study on New MCP Reflection X-ray Sensitive Film of Variable Density Halide[J]. Chinese Journal of Luminescence, 2002,23(5): 513-517 DOI:

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TIAN Jing-quan
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NA Yan-xiang
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XIANG Rong
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Related Institution

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.214 Institute of China Ordnance Industry, Bengbu
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