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Surface and Interface Analysis of LiBq4/ITO Using Atomic Force Microscopy (AFM) and X-ray Photoelectron Spectroscopy (XPS)
更新时间:2020-08-11
    • Surface and Interface Analysis of LiBq4/ITO Using Atomic Force Microscopy (AFM) and X-ray Photoelectron Spectroscopy (XPS)

    • Chinese Journal of Luminescence   Vol. 26, Issue 3, Pages: 337-343(2005)
    • CLC: TN383.1;TN873.3
    • Received:05 June 2004

      Revised:06 December 2004

      Published:20 May 2005

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  • OU Gu-ping, GUI Wen-ming, JIN Shi-chao, ZHANG Fu-jia. Surface and Interface Analysis of LiBq<sub>4</sub>/ITO Using Atomic Force Microscopy (AFM) and X-ray Photoelectron Spectroscopy (XPS)[J]. Chinese Journal of Luminescence, 2005,26(3): 337-343 DOI:

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