您当前的位置:
首页 >
文章列表页 >
Surface and Interface Analysis of LiBq4/ITO Using Atomic Force Microscopy (AFM) and X-ray Photoelectron Spectroscopy (XPS)
更新时间:2020-08-11
    • Surface and Interface Analysis of LiBq4/ITO Using Atomic Force Microscopy (AFM) and X-ray Photoelectron Spectroscopy (XPS)

    • Chinese Journal of Luminescence   Vol. 26, Issue 3, Pages: 337-343(2005)
    • CLC: TN383.1;TN873.3
    • Published:20 May 2005

      Received:05 June 2004

      Revised:06 December 2004

    移动端阅览

  • OU GU-PING, GUI WEN-MING, JIN SHI-CHAO, et al. Surface and Interface Analysis of LiBq4/ITO Using Atomic Force Microscopy (AFM) and X-ray Photoelectron Spectroscopy (XPS). [J]. Chinese journal of luminescence, 2005, 26(3): 337-343. DOI:

  •  
  •  

0

Views

51

下载量

0

CSCD

Alert me when the article has been cited
提交
Tools
Download
Export Citation
Share
Add to favorites
Add to my album

Related Articles

Degradation Mechanism of Pd/p-GaN Ohmic Contacts
Transient Current Response Characteristics of Organic Light-emitting Diodes
Defect Study at The Surface of (Cu,Al)-doped ZnO Thin Film by Raman Spectra
Theory on Geometrical Structure and Electronic Configuration of Electroplex at the TPD/PBD Interface in Organic Light-emitting Diodes
Study on UV Excitation Spectra of Eu3+ or Tb3+ doped Y2O3 Nanomaterials

Related Author

Hui YANG
Rong-xin WANG
Fan ZHANG
Si-yi HUANG
Ai-qin TIAN
Jian-ping LIU
CHU Xin-bo
GUAN Min

Related Institution

Key Laboratory of Nano-devices and Applications, Suzhou Institute of Nano-Tech and Nano-Bionics, Chinese Academy of Sciences
School of Physical Science and Technology, Shanghai Tech University
Vacuum Interconnected Nanotech Workstation, Suzhou Institute of Nano-Tech and Nano-Bionics, Chinese Academy of Sciences
Key Laboratory of Semiconductor Materials Science, Institute of Semiconductors, Chinese Academy of Sciences
Shanghai Institute of Ceramics, Chinese Academy of Sciences, Shanghai 200050, China
0