Induced Crystallization of Hole Transport Layer by Buffer Layer in Organic Light Emitting Diodes

XU Qin-qin; ZHANG Ji-dong; CHEN Jiang-shan; MA Dong-ge; YAN Dong-hang

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Induced Crystallization of Hole Transport Layer by Buffer Layer in Organic Light Emitting Diodes

更新时间：2020-08-11

- Induced Crystallization of Hole Transport Layer by Buffer Layer in Organic Light Emitting Diodes
- Chinese Journal of Luminescence Vol. 26, Issue 1, Pages: 89-94(2005)
- 作者机构：
  
  中国科学院长春应用化学研究所高分子物理与化学国家重点实验室, 吉林, 长春, 130022
- 作者简介：
- 基金信息：
- DOI：
  CLC： TN383.1;TN873.3
- Published：20 January 2005
- 稿件说明：
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徐芹芹, 张吉东, 陈江山, 马东阁, 闫东航. 有机电致发光器件中由缓冲层薄膜诱导产生的空穴传输层薄膜的结晶化(英文)[J]. 发光学报, 2005,26(1): 89-94

XU Qin-qin, ZHANG Ji-dong, CHEN Jiang-shan, MA Dong-ge, YAN Dong-hang. Induced Crystallization of Hole Transport Layer by Buffer Layer in Organic Light Emitting Diodes[J]. Chinese Journal of Luminescence, 2005,26(1): 89-94
徐芹芹, 张吉东, 陈江山, 马东阁, 闫东航. 有机电致发光器件中由缓冲层薄膜诱导产生的空穴传输层薄膜的结晶化(英文)[J]. 发光学报, 2005,26(1): 89-94 DOI：

XU Qin-qin, ZHANG Ji-dong, CHEN Jiang-shan, MA Dong-ge, YAN Dong-hang. Induced Crystallization of Hole Transport Layer by Buffer Layer in Organic Light Emitting Diodes[J]. Chinese Journal of Luminescence, 2005,26(1): 89-94 DOI：

摘要

有机薄膜层的结晶是有机电致发光器件衰减的主要机理之一。研究发现以CuPc做为缓冲层时比没有缓冲层时NPB薄膜更容易结晶

CuPc对NPB薄膜具有诱导结晶作用。通过原子力显微镜(AFM)以及宽角X射线衍射(WAXRD)详细研究了不同厚度、不同颗粒大小的缓冲层CuPc薄膜对空穴传输层NPB薄膜的结晶诱导作用。这个发现为以下结论提供了证据

以CuPc薄膜做为缓冲层的OLED器件的长期衰减可部分归结于由缓冲层CuPc引起的空穴传输层NPB薄膜的结晶。

Abstract

Crystallization of organic thin films is one of the main degradation mechanisms of organic light emitting diodes (OLEDs). The induced crystallization of N

N′-di(naphthalene-1-yl) N

N′-diphenyl-benzidine (NPB) thin films by copper phthalocyanine (CuPc) buffer layer with different thickness and nucleus sizes was studied by atomic force microscopy (AFM) and wide angle X-ray diffraction (WAXRD). It was found that the NPB with CuPc as buffer layer crystallized more easily than that without CuPc buffer layer

and CuPc films can induce the crystallization of NPB films. These results may provide evidence that the long-term degradation of an OLED with CuPc as buffer layer can be partially attributed to the crystallization of the hole-transporting layer NPB induced by CuPc.

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