X-ray diffraction curves of Ⅱ-Ⅵ compound strained-layer superlattice grown by metal organic chemical vapor deposition (MOCVD) were measured by using computercontroled X-ray diffractometer.The multiplicate peaks of the superlattice structure were observed.The intensity of satellite peaks veries periodically with diffraction angles.Analysis and discussion for the X-ray diffraction curves were carried out by using X-ray kinematic diffraction theory.The structure parameters of the samples were calculated with photoluminescence (PL) and the width of envelope peak.