Peng Junbiao, Hua Yulin, Xu Xurong, Lü Ande, Sun Runguang, Li Gengxin. STUDIES ON INFLUENCE OF THE THICKNESS OF LUMINESCENT LAYER ON THE EL PROPERTIES IN ORGANIC THIN FILM ELECTROLUMINESCENCE[J]. Chinese Journal of Luminescence, 1994,15(1): 9-14
Peng Junbiao, Hua Yulin, Xu Xurong, Lü Ande, Sun Runguang, Li Gengxin. STUDIES ON INFLUENCE OF THE THICKNESS OF LUMINESCENT LAYER ON THE EL PROPERTIES IN ORGANIC THIN FILM ELECTROLUMINESCENCE[J]. Chinese Journal of Luminescence, 1994,15(1): 9-14DOI:
STUDIES ON INFLUENCE OF THE THICKNESS OF LUMINESCENT LAYER ON THE EL PROPERTIES IN ORGANIC THIN FILM ELECTROLUMINESCENCE
three organic thin film electroluminescence (OTFEL) cells with different thickness of luminescent layer:300Å
600Å
1500Å
were prepared. The OTFEL cells were the structure of single layer
and the 8-hydroxyquinoline aluminum was used as a luminescent layer. Comparing and analysising their properties of
I-V
and
B-I
it is conformed that the thickness of luminescent layer drastically influences the brightness of OTFEL cells. The cause were discussed by transport processes of electrons and holes in luminescent layer under DC current.
Synthesis of Triphenylmethyl Modified Oil-soluble Carbon Quantum Dots and Their Applications in Light-emitting Devices
Thickness and Surface Roughness Effect on Lighting Performance of Ce3+: YAG Transparent Ceramics Based High Power LED and LD Lighting Prototype Devices
Influence of Encapsulated Silica Gel on Output Luminous Flux of Deep Sea LED Light Source
Electrochromic Properties of WO3 Film by Spin-coating
Fabrication and Properties of Quantum-dots Backlight Light Guide Plate
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Key Laboratory of Interface Science and Engineering in Advanced Materials, Ministry of Education, Taiyuan University of Technology
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